The manual DC probe station supports DC parametric measurements with semiconductor parameter analyzers, and allows integration with standard characterization instruments for a wide range of device measurement test setups.

https://lh6.googleusercontent.com/5CWDmm_CigPg4lRnxs-mKyyWCQ1tnDMexjepifqF5YXGSyrJ0mcAIMBUyj3A9tupa-2nXwSafoysPRptSo3QoIRXl2mVmBVY4uIPxeiDhispDqBR48amtu8T_clXAB4S_Wk6A_Ie
Model : BD-6DC
Brand : Precise Measurement Technologies

 

Equipment Measurements & Analysis

1 I-V, C-V, C-f, C-t measurements with range DC to 10 MHz

 

Modules Available:

 

High-Resolution microscope 10X & 30X resolution
Wafer chuck wafer with diameter upto 150 mm
Temperature Control unit Room temperature to 200 degree Celsius
Dark box, capable of EMI shielding Manipulators 6 Nos

Status of the Instrument : Active

Location of the Instrument : Nila  Campus , IIT Palakkad

 

Regular measurements: 

 

Sample Submission Form ( Internal users )

 

For Slot booking (Internal users)

https://my.labagenda.com/index.php?redirect=