The semiconductor parameter analyser integrates multiple measurement and analysis capabilities to perform the current‐voltage (I-V) and capacitance measurements [C-V (capacitance‐voltage), C‐f (capacitance-frequency), and C‐t (capacitance-time)] accurately.
Model: B1500A
Brand: Keysight
Possible Measurements & Analysis
| 1 | Current-Voltage (I-V) measurements |
| 2 | Capacitance- Voltage (C-V) measurements |
| 3 | Capacitance- Frequency (C-f) measurements |
| 4 |
Capacitance- Time (C-t) measurements |
Modules Available:
| High-Resolution Source Measure Units (SMU) | 3 Nos. |
| High-Power SMU | 1 Nos. |
| Multi-Frequency Capacitance Measure Unit (MFCMU) | 1 Nos. (10kHz 5MHz) |
| Waveform Generator Unit (WGFMU) | 1 Nos. |
| Ground Unit | 4.2 A sink current |
| Upgradability and Support | 9 slot modules |
Status of the Instrument : Active
Location of the Instrument : Nila Campus , IIT Palakkad
Regular measurements:
1. DC Probe Station (RT to 150 0 C) with Semiconductor Parameter Analyser
2. Semiconductor Parameter Analyser
Submission Form ( Internal users )
For Slot booking (Internal users)
https://my.labagenda.com/