Model: AEP Nanomap 1000WL I

Equipment Measurements & Capabilities:

1 To measure the surface features (Roughness parameters, topography, height variation, material loss, etc) with 3-dimensional imaging
2  Max. Scan Range: Up to 10 mm
3 Lateral Resolution: 0.38 µm min
4 Max Scan Speed: 47 µm/sec

 

Status of the Instrument : Active

Location of the Instrument : Nila Campus , IIT Palakkad

Regular Measurements: