Model: AEP Nanomap 1000WL I
Equipment Measurements & Capabilities:
| 1 | To measure the surface features (Roughness parameters, topography, height variation, material loss, etc) with 3-dimensional imaging |
| 2 | Max. Scan Range: Up to 10 mm |
| 3 | Lateral Resolution: 0.38 µm min |
| 4 | Max Scan Speed: 47 µm/sec |
Status of the Instrument : Active
Location of the Instrument : Nila Campus , IIT Palakkad
Regular Measurements:
Sample Submission Forms ( Internal users )
For Slot booking (Internal users)
https://my.labagenda.com/
Sample Submission Forms (External Users)