Model : Gemini SEM 300
Brand : Carl Zeiss
Equipment Measurements & Capabilities:
| 1 | To examine metallic/non-metallic specimens’ microstructure at 2000000 X magnification with the resolution of 0.8nm at 15 kV; 1.3 nm at 1 kV |
| 2 | EDS (EDAX-make) attachment to detect its chemical composition |
| 3 | EBSD (EDAX-make) attachment to analyse the texture (orientation) of microstructure of metallic components |
| 4 | Lithography - Raith Lithography system (ELPHY Multibeam 20 MHz ) with Zeiss Electrostatic beam blanker attachment for electronic micro device fabrication |
Status of the Instrument : Active
Location of the Instrument : Nila Campus , IIT Palakkad
Regular Measurements:
Sample Submission Forms ( Internal Users )
For Slot booking (Internal users)